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Title - Auger Parameter Energies

        
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Cu, Copper

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COPPER S E 2p3/2 L3M45M45 A.P. Ref.
Cu 26 3 932.67t 918.65t 1851.32t 84-1
Al2Cu     933.9 918.0 1851.9 77-8
CuP2     932.4     75-12
CuAgSe     931.9 917.7 1849.6 78-10
Cu2Se 3 1 931.9 917.6 1849.5 78-10
Cu2S 7 1 932.4     80-23
CuS 6 1 932.3     80-7
CuFeS2 2   932.0     80-7
Cu(CN)2     932.4     83-4
CuAI2O4 2   934.7     85-12
CuCr2O4 2   934.6     82-3
CuFe2O4 2   933.8     80-16
Cu2O 14   932.4 916.8 1849.4 83-20
CuO 16 1 933.8 917.9 1851.7 79-18
CuCl 5   932.4 915.6 1848.0 77-11
CuCl2 7 3 934.4 915.5 1849.9 77-11
CuInSe2 2   931.8 917.6 1849.4 85-2
CuF2 5 2 936.1 916.0 1852.1 77-11
 

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t References 84-1, 81-9, 82-29, 80-6, 82-14 and othcrs were efforts to obtain accurate line energies relative to the Fermi Ievel.

 

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Notes
S Number of independent studies (where this is greater than 1)
E Number of these rejected as unsound (mainly early measurements) before the remaining ones were used to determine a mean value
A.P Auger parameter (calculated from the most intense photoelectron line and Auger line)
M.A.P. Modified Auger Parameter
v Referenced to the vacuum level (gases)
c Includes minor corrections in high binding energy lines using X-ray energy data from reference 67-1
Refs. Reference in which the data was originally published. (See the references section)
  

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Last updated 24 February, 2001

Compiled by and
Christopher Walker
KLA-Tencor,
686 Stirling Road
Slough
Berks., UK
Simon Morton
Advanced Light Source
Lawrence Berkeley Laboratory
Berkeley
CA 94720
email chris.walker@physics.org email S.Morton@uksaf.org

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© UK Surface Analysis Forum 1998