|
| NICKEL |
S |
E |
2p3/2 |
L3VV |
A.P. |
Ref. |
| Ni |
|
|
852.68 |
|
|
81- 9 |
| Ni |
18 |
1 |
852.7 |
846.2 |
1698.9 |
82-14 |
| Al3Ni |
|
|
853.75 |
|
|
82-7 |
| AuNi |
|
|
852.15 |
|
|
82- 7 |
| NiB |
|
|
853.2 |
|
|
80- 27 |
| Ni2P |
|
|
853.1 |
|
|
83- 16 |
| Ni2Si |
3 |
|
853.0 |
|
|
82-6 |
| NiS |
2 |
|
852.8 |
|
|
79- 14 |
| NiO |
18 |
7 |
854.4 |
|
|
82-6 |
| Ni2O3 |
2 |
|
856.0 |
|
|
81-12 |
| Ni(OH)2 |
9 |
2 |
855.9 |
|
|
81-12 |
| Ni(CO)4 |
2 |
|
854.4 |
|
|
81-8 |
| NiCl2 |
4 |
|
856.7 |
|
|
83-13 |
| NiAl2O4 |
6 |
2 |
856.2 |
|
|
81-12 |
| NiSO4 |
4 |
|
856.8 |
|
|
79-14 |
| Ni-(dimethyl- glyoxime)2 |
4 |
|
854.8 |
842.4 |
1697.2 |
79-17 |
| Ni(acac)2 |
3 |
|
855.7 |
842.4 |
1698.6 |
79-17 |
| NiSiO3 |
2 |
|
856.9 |
841.4 |
1698.3 |
79-17 |
| NiF2 |
3 |
1 |
857.4 |
842.4 |
1699.8 |
79-17 |
|
| |
|
| |
Notes
| S |
Number of independent studies (where this is greater than 1) |
| E |
Number of these rejected as unsound (mainly early measurements) before the remaining
ones were used to determine a mean value |
| A.P |
Auger parameter (calculated from the most intense photoelectron line and Auger line) |
| M.A.P. |
Modified Auger Parameter |
| v |
Referenced to the vacuum level (gases) |
| c |
Includes minor corrections in high binding energy lines using X-ray energy data from reference 67-1 |
| Refs. |
Reference in which the data was originally published. (See the references
section) |
|
| |
|
Last updated 24 February, 2001
| Compiled by |
and |
Christopher Walker
KLA-Tencor,
686 Stirling Road
Slough
Berks., UK |
Simon Morton
Advanced Light Source
Lawrence Berkeley Laboratory
Berkeley
CA 94720 |
| email chris.walker@physics.org |
email S.Morton@uksaf.org |
© UK Surface Analysis Forum 1998
|
|
