|
| TIN |
S |
E |
3d5/2 |
M4N45N45 |
A.P. |
4d5/2 |
Ref. |
| Sn |
|
|
484.92 |
|
|
23.95 |
81-22 |
| Sn |
17 |
|
484.87 |
437.27 |
922.7 |
23.68 |
79- 13 |
| SnTe |
|
|
485.6 |
|
|
25.5 |
77-22 |
| SnSe |
|
|
485.7 |
|
|
25.7 |
77-22 |
| SnS |
3 |
1 |
485.6 |
435.7 |
921.3 |
|
75-14 |
| SnO |
6 |
2 |
486.9 |
|
|
|
79-19 |
| SnO2 |
11 |
|
486.6 |
432.6 |
919.2 |
|
77-14 |
| CdSnO3 |
|
|
486.1 |
|
|
|
83-9 |
| BaSnCl4 |
|
|
486.8 |
|
|
|
79-19 |
| Me2SnF2 |
|
|
487.1 |
|
|
|
79-19 |
| Me3SnF |
|
|
486.7 |
|
|
|
75-5 |
| Ph3SnOH |
|
|
485.6 |
|
|
|
79-19 |
| Ph3SnSSnPh3 |
|
|
485.3 |
|
|
|
79-19 |
| Ph4Sn |
4 |
|
486.3 |
|
|
|
73-15 |
| SnBr2 |
|
|
486.9 |
|
|
|
73-5 |
| SnC12 |
2 |
|
486.7 |
|
|
|
79-9 |
| SnF2 |
3 |
|
487.4 |
|
|
|
80-29 |
| SnF4 |
2 |
|
488.2 |
|
|
|
80-29 |
| NaSnF3 |
|
|
487.4 |
430.8 |
918.2 |
|
75-14 |
| SnCl2(g) |
|
|
|
420.24v |
|
|
79-13 |
|
| |
|
| |
Notes
| S |
Number of independent studies (where this is greater than 1) |
| E |
Number of these rejected as unsound (mainly early measurements) before the remaining
ones were used to determine a mean value |
| A.P |
Auger parameter (calculated from the most intense photoelectron line and Auger line) |
| M.A.P. |
Modified Auger Parameter |
| v |
Referenced to the vacuum level (gases) |
| c |
Includes minor corrections in high binding energy lines using X-ray energy data from reference 67-1 |
| Refs. |
Reference in which the data was originally published. (See the references
section) |
|
| |
|
Last updated 24 February, 2001
| Compiled by |
and |
Christopher Walker
KLA-Tencor,
686 Stirling Road
Slough
Berks., UK |
Simon Morton
Advanced Light Source
Lawrence Berkeley Laboratory
Berkeley
CA 94720 |
| email chris.walker@physics.org |
email S.Morton@uksaf.org |
© UK Surface Analysis Forum 1998
|
|
