The following is a list of links to companies
agencies and academic departments offering to supply analytical
services, complete systems, analytical instrumentation or components/spares to the surface science community as well as links to other indexes of commercial resources.
Software for the analysis of surface science data is listed
separately. Please read our disclaimer before making use of any of these services or downloading
software.
Analytical Services
- Accurel
Systems
extensive set of advanced instruments that address: materials
characterisation, FIB modification of masks & devices,
surface analysis, and failure analysis. SEM, FE-SEM/EDX,
AES, FE-AES, FIB, TXRF, SIMS, XRD, XRR, AFM, CIVVA, RBS,
SAM, TEM
- Advanced
Materials Surfaces and Interfaces Group, The Robert Gordon
University, Aberdeen
Imaging XPS, STM, AFM, Auger, LEED, SEM, Contact
angle analysis
- Centre for
Electron Spectroscopy and Surface Analysis
Commercial XPS
- Corrosion and Protection Centre , Materials
Research University of Manchester
SEM, TEM, SPM, XPS
- CSMA
Limited
Commercial SIMS, XPS, SEM, Non-contact surface
profiling, TEM, EELS, RBS, FTIR, GDMS, and VPD.
- Evans Analytical Group
This site also contains extensive general information
on surface science and its techniques.
- Geller
MicroÅnalytical Laboratory
Commercial AES, EPMA, SEM, Metallography, Profilometry.
ISO-9001 certified chemical and magnification callibration
standards.
- Interface
Analysis Centre, University of Bristol.
Commercial SAM, AES, FIB, ToF and magnetic
sector SIMS, (E)SEM, EDX, Raman Spectroscopy,
XPS and Imaging XPS.
- Intertek
Measurement Science Group
Wide ranging analytical and physical science commercial
service provider, including high resolution XPS, high resolution ToFSIMS, imaging SIMS, contact angle,
optical microscopy, SEM, EDX, TEM, EELS, XRF, Raman,
FTIR etc.
- Loughborough
Surface Analysis Ltd
surface chemical analysis and sputter depth profiling
by SIMS and Auger.LPD Lab
Services
Analytical services with an emphasis on practical
solutions to industrial process problems. Includes
XPS, Auger, SIMS, SEM, EDX, XRF, FTIR, UV-Vis,
atomic absorption, chromatography.
- Molecular
Profiles
Contract laboratory offering AFM, ToF-SIMS, XPS etc.
- NCESS
Commercial XPS, imaging XPS, EDX and plasma
processing
- NPL,
The National Physical Laboratory.
Quantification and calibration services to Industry and
Academia.
- Shell
Global Solutions Analytical Technology
Full range of analytical services and
consultancy.
- Structure
Probe, Inc
SEM, EDS, TEM, SAED, ultramicrotomy (room temperature
and cryo), ion milling, LM and image analysis.
- Tascon
(Germany), Tascon (USA)
Characterisation of all kinds of surface
- Winnats
Access to a wide range of surface analysis and other
analytical techniques
Complete Analytical Systems
- Cameca
Manufacture magnetic sector
and quadrupole-based SIMS instruments, EPMA, Atom Probe and LEXES
-
Hitachi Instruments
SEM, AFM
- Horiba Jobin Yvon
Analytical and spectroscopic systems and components
- Ion-TOF
Systems for Time-of-Flight SIMS and LEIS
- Jeol
Equipment for a wide variety of surface analysis techniques.
- Kratos
Analytical
XPS & Maldi instrumentation
- Micro
Materials
Modular instruments for nanoindentation and
nanotribometry
- Millbrook
Instruments
Desktop instrumentation for static, imaging and
dynamic SIMS
- NT-MDT
Co. (Molecular Devices and Tools for NanoTechnology)
Russian supplier of SPM systems and spares.
- Omicron
NanoTechnology
Multi technique ARUPS, MBE, SPM, SAM, LEED, ESDIAD sytems
- Phi
- Physical Electronics
Wide range of surface science analytical systems.
- RHK Technology
Manufacture UHV compatible
SPM systems.
- Specs
Supplies surface systems
- Thermo
Fisher Scientific
XPS and AES instrumentation
- Veeco
Instruments (world)
AFM systems, Surface Metrology Instrumantation, Optical
Scatterometers
- VG
Scienta
High resolution electron spectroscopy system.
- VSW
Ltd.
A range of scientific instruments for surface
science
- Zeiss
An electron microscopy company
Analytical Instrumentation, Detectors etc
- Allectra
Supplier of high vacuum and UHV components
- Casa XPS
Processing software for XPS, AES, SIMS
- FEI
Electron microscopy and focused ion beam
products and components.
- Hiden
Quadrupole mass spectrometers for vacuum, gas,
plasma and surface analysis
- Ionoptika
Limited
Manufacturer of Ion Beam Systems and Surface
Analysis Components
Jeol
Equipment for a wide variety of surface analysis techniques,
electron microscopes etc.
- Kore
Design and build customised mass spectrometers,
related components, and other vacuum-based equipment
- NT-MDT
Co. (Molecular Devices and Tools for NanoTechnology)
Russian supplier of SPM systems and spares.
- Omicron
NanoTechnology
Hemispherical and cylindrical analysers, evaporators,
X-ray sources, SPM/STM etc.
- Oxford
Applied Research
UHV and HV components and systems for the deposition and
characterisation of thin films
- PSP Vacuum
Technology
Range of surface science components and UHV systems
- Scanwel
Vacuum components and custom fabrication and
chambers
- SPECS
GmbH, Surface Analysis and Computer Technology
Analytical Instrumentation (e.g. XPS, SNMS, LEED, EELS etc.) for surface science
and thin film applications
- Thermo Fisher Scientific
Manufacturer of analysers and sources for surface
analysis.
- Veeco
Instruments (world)
AFM systems, Surface Metrology Instrumantation, Optical
Scatterometers
- VG
Scienta
Analytical systems for surface analysis.
- VSW
Ltd.
Analytical systems for electron spectroscopy
- York
Probe Services Ltd
Electron sources for a wide variety of uses
Upgrades, Maintenance, Vacuum Components, Spares, Pumps etc.
Other Indexes of Commercial Suppliers
- Analyticon
Directory of analytical instrument suppliers around the
world.
- Microscopy
and Microanalysis Products and Services
Commercial resources for optical and electron microscopy.
- Physics
Net
Searchable index, provided by the UK Institute of Physics,
of 1900 products and 2500 companies supplying equipment
or services to scientist
- Semiconductor Subway
Semiconductor and microsystems related information, including
fabrication facilities, research activities, standards
work, etc.
|