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"Multi-Technique Problem Solving in an Industrial Environment"

Shell, Thornton Laboratories, Chester- Wednesday 6th of January 1999

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Parallel Workshop Sessions

"Dirty Samples:- How Do We Clean Them To Extract Useful data? "

Leader:- Dr. S. J. Harris
Raporteur:- Dr. K. R. Hallam

Steven started out by first raising the question: "Do we allow dirty samples to enter our instruments?" Of course, in an ideal World, we wouldn't. However, the World (apart from NPL) is far from ideal, so we do have to analyse dirty samples. Assuming that it is not the actual contamination itself that we are seeking to identify, we must remove the contamination in some way and this is, perhaps, an area in which the group might like to pool its ideas. A list of techniques was produced (solvents, ion beams, chemicals, plasmas, lasers, CO2, etc.) and the discussion then proceeded to try and identify the best techniques to use for a variety of sample types. Firstly, though, we quickly dismissed the use of all techniques when preparing samples for SIMS analysis - we would be left to only analyse the cleaning method, rather than the sample. We also reminded ourselves of the importance of being aware of the chemical state effects of our chosen method, most especially if in advance of any XPS analysis.

An addition was made to the list to cover the use of gas streams to remove surface particulate contamination. Blowing (from the mouth) was a sure-fire way to introduce additional contamination onto the sample surface and "Dust-Off"-type sprays were well capable of introducing carbon layers onto the sample. Instead, it was far better to use either dry N2 from a gas cylinder or a simple puffer.

Solvents have been shown to have various effects on sample surfaces. Contamination left behind or introduced, or surface oxidation has been shown to depend on the particular type of organic solvent used and on the grade (GPR, Analar, etc.) selected. Acetone was agreed to be on e of the worst organic solvents with regards to residues left behind. If acetone had to be used, then it should be followed by a further cleaning with, say, methanol. Environmental concerns were also now playing their part, limiting our choice of solvents. Returning to our ideal World, we would carry out studies to select the most appropriate solvent to remove any particular contamination and have minimal effects on the results we obtain. This, though, is usually precluded by a lack of time and money.

Words such as "dangerous" and "aggressive" were used throughout the discussion on chemical cleaning, and it was generally felt that such techniques were more for the removal of surface layers of samples rather than for simple cleaning prior to analysis.

Low power lasers had been shown capable of selectively removing organic layers from both metals and polymeric materials, though there was considerable time and effort required to calibrate any such system. Of more interest to those present in the workshop was the use of CO2-based cleaning systems. Though there was limited experience among the workshop participants of these tools, there were two variants discussed: a) supercritical CO2, which acts like a solvent - an excellent, if rather expensive, method for removing oxides, e.g. from the inside of pipework, and much used by the aerospace industry; and b) DRICE - which could be described as sand blasting using CO2 pellets, where solvent, impact and cooling effects combine to be effective in, for instance, paint removal, though the effects of condensation should be taken into consideration and hot air lines used where necessary.

Other methods covered included heating within UHV, obviously the standard method for the preparation of single crystal specimens, cellulose acetate replicas, for pulling away contaminant particles, uv/ozone, ex-situ plasmas (good for removing organic layers) and mechanical abrasion (e.g. corks!).

A table was completed to indicate where we believed particular methods could (within all the limitations discussed) be applied for metallic, polymeric and semiconductor samples. We concluded by reminding ourselves that all cleaning methods have an effect on the specimen, and it is most important to understand the possible effects of any cleaning on the results we subsequently obtain and to pass on this understanding to the "customer" who brings along the dirty sample in the first place.

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Last updated 24 February, 2001

Simon Morton
Advanced Light Source
Lawrence Berkeley Laboratory
Berkeley
CA 94720

Comments or enquiries to S.Morton@uksaf.org

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