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Surface Science Techniques Title

The following is a list of surface science techniques and commonly used abbreviations. Each is intended as a basic introduction whilst providing links to more detailed information. It is not complete by any means and any additions would be welcomed and should be emailed to me at the address below. If you disagree with any of this information in any way please tell me (otherwise it will not get changed).

If this list doesn't contain the techniques you are looking for then you could try the ones at Charles Evans and Associates (fewer techniques but excellent information and a useful table of the strengths and weakness of different techniques) or the very similar one at Evans Europa. Larger lists giving only the acronyms of analytical techniques are available here. Complete lists of all scientific acronyms or abbreviations are available from the WWW acronym server.

Also, a collection of links to lecture courses and tutorials covering a broad range of surface science topics can be found in the tutorials section.


Acronym

Technique

AEAPS

Auger Electron Appearance Potential Spectroscopy

AES

Auger Electron Spectroscopy

AFM

Atomic Force Microscopy

APECS

Auger Photoelectron Coincidence Spectroscopy

APFIM

Atom Probe Field Ion Microscopy

APS

Appearance Potential Spectroscopy

ARPES

Angle Resolved Photoelectron Spectroscopy

ARUPS

Angle Resolved Ultraviolet Photoelectron Spectroscopy

ATR

Attenuated Total Reflection

BEEM

Ballistic Electron Emission Microscopy

BIS

Bremsstrahlung Isochromat Spectroscopy

CFM

Chemical Force Microscopy

CHA

Concentric Hemispherical Analyser

CMA

Cylindrical Mirror Analyser

CPD

Contact Potential Difference

CVD

Chemical Vapour Deposition

DAFS

Diffraction Anomalous Fine Structure

DAPS

Disappearance Potential Spectroscopy

DRIFT

Diffuse Reflectance Infra-Red Fourier Transform

EAPFS

Extended Appearance Potential Fine Structure

EDX

Energy Dispersive X-ray Analysis

EELS

Electron Energy Loss Spectroscopy

 

Ellipsometry, see RDS

EMS

Electron Momentum Spectroscopy

EPMA

Electron Probe Micro-Analysis

ESCA

Electron Spectroscopy for Chemical Analysis

ESD

Electron Stimulated Desorption

ESDIAD

Electron Stimulated Desorption Ion Angle Distributions

EXAFS

Extended X-ray Absorption Fine Structure

FEM

Field Emission Microscopy

FIM

Field Ion Microscopy

FTIR

Fourier Transform Infra Red

FT RA-IR

Fourier Transform Reflectance-Absorbtion Infra Red

HAS

Helium Atom Scattering

HDA

Hemispherical Deflection Analyser

HEIS

High Energy Ion Scattering

HREELS

High Resolution Electron Energy Loss Spectroscopy

IETS

Inelastic electron tunneling spectroscopy

KRIPES

k-Resolved Inverse Photoemission Spectroscopy

ILS

Ionisation Loss Spectroscopy

INS

Ion Neutralisation Spectroscopy

IPES

Inverse Photoemission Spectroscopy

IRAS

Infra-Red Absorbtion Spectroscopy

ISS

Ion Scattering Spectroscopy

LEED

Low Energy Electron Diffraction

LEEM

Low Energy Electron Microscopy

LEIS

Low Energy Ion Scattering

LFM

Lateral Force Microscopy

MBE

Molecular Beam Epitaxy

MBS

Molecular Beam Scattering

MCXD

Magnetic Circular X-ray Dichroism

MEIS

Medium Energy Ion Scattering

MFM

Magnetic Force Microscopy

MIES

Metastable Impact Electron Spectroscopy

MIR

Multiple Internal Reflection

MOCVD

Metal Organic Chemical Vapour Deposition

MOKE

Magneto-Optic Kerr Effect

NIXSW

Normal Incidence X-ray Standing Wave

NEXAFS

Near-Edge X-ray Absorption Fine Structure

NSOM

Near Field Scanning Optical Microscopy

PAES

Positron annihilation Auger Electron Spectroscopy

PECVD

Plasma Enhanced Chemical Vapour Deposition

PEEM

Photo Emission Electron Microscopy

Ph.D.

Photoelectron Diffraction

PIXE

Proton Induced X-ray Emission

PSD

Photon Stimulated Desorption

RAIRS

Reflection Absorbtion Infra-Red Spectroscopy

RAS

Reflectance Anisotropy Spectroscopy

RBS

Rutherford Back Scattering

RDS

Reflectance Difference Spectroscopy

REFLEXAFS

Reflection Extended X-ray Absorption Fine Structure

RFA

Retarding Field Analyser

RHEED

Reflection High Energy Electron Diffraction

RIfS

Reflectometric Interference Spectroscopy

SAM

Scanning Auger Microscopy

SEM

Scanning Electron Microscopy

SEMPA

Scanning Electron Microscopy with Polarisation Analysis

SERS

Surface Enhanced Raman Scattering

SEXAFS

Surface Extended X-ray Absorption Spectroscopy

SHG

Second Harmonic Generation

SH-MOKE

Second Harmonic Magneto-Optic Kerr Effect

SIMS

Secondary Ion Mass Spectrometry

SKS

Scanning Kinetic Spectroscopy

SMOKE

Surface Magneto-Optic Kerr Effect

SNMS

Sputtered Neutral Mass Spectrometry

SNOM

Scanning Near Field Optical Microscopy

SPIPES

Spin Polarised Inverse Photoemission Spectroscopy

SPEELS

Spin Polarised Electron Energy Loss Spectroscopy

SPLEED

Spin Polarised Low Energy Electron Diffraction

SPM

Scanning Probe Microscopy

SPR

Surface Plasmon Resonance

SPUPS

Spin Polarised Ultraviolet Photoelectron Spectroscopy

SPXPS

Spin Polarised X-ray Photoelectron Spectroscopy

STM

Scanning Tunnelling Microscopy

SXAPS

Soft X-ray Appearance Potential Spectroscopy

SXRD

Surface X-ray Diffraction

TDS

Thermal Desorption Spectroscopy

TEAS

Thermal Energy Atom Scattering

TIRF

Total Internal Reflectance Fluorescence

TPD

Temperature Programmed Desorption

TPRS

Temperature Programmed Reaction Spectroscopy

TXRF

Total Reflection X-ray Fluorescence

UHV

Ultra High Vacuum

UPS

Ultraviolet Photoemission Spectroscopy

XANES

X-ray Absorption Near-Edge Structure

XPD

X-ray Photoelectron Diffraction

XPS

X-ray Photoemission Spectroscopy

XRR

X-ray Reflectometry

XSW

X-ray Standing Wave