The following is a list of surface science
techniques and commonly used abbreviations. Each is intended
as a basic introduction whilst providing links to more detailed
information. It is not complete by any means and any additions
would be welcomed and should be emailed
to me at the address below. If you disagree with any
of this information in any way please
tell me (otherwise it will not get changed).
If this list doesn't contain the techniques
you are looking for then you could try the ones at Charles
Evans and Associates (fewer techniques but excellent
information and a useful table of the strengths and weakness of different techniques) or
the very similar one at Evans
Europa. Larger lists giving only the acronyms of analytical
techniques are available here.
Complete lists of all scientific acronyms or abbreviations
are available from the WWW
acronym server.
Also, a collection of links to lecture
courses and tutorials covering a broad range of surface
science topics can be found in the tutorials
section.
| Acronym |
Technique |
AEAPS |
Auger Electron Appearance Potential
Spectroscopy |
AES |
Auger Electron Spectroscopy |
AFM |
Atomic Force Microscopy |
APECS |
Auger Photoelectron Coincidence Spectroscopy |
APFIM |
Atom Probe Field Ion Microscopy |
APS |
Appearance Potential Spectroscopy |
ARPES |
Angle Resolved Photoelectron Spectroscopy |
ARUPS |
Angle Resolved Ultraviolet Photoelectron
Spectroscopy |
ATR |
Attenuated Total Reflection |
BEEM |
Ballistic Electron Emission Microscopy |
BIS |
Bremsstrahlung Isochromat Spectroscopy |
CFM |
Chemical Force Microscopy |
CHA |
Concentric Hemispherical Analyser |
CMA |
Cylindrical Mirror Analyser |
CPD |
Contact Potential Difference |
CVD |
Chemical Vapour Deposition |
DAFS |
Diffraction Anomalous Fine Structure |
DAPS |
Disappearance Potential Spectroscopy |
DRIFT |
Diffuse Reflectance Infra-Red Fourier
Transform |
EAPFS |
Extended Appearance Potential Fine
Structure |
EDX |
Energy Dispersive X-ray Analysis |
EELS |
Electron Energy Loss Spectroscopy |
|
Ellipsometry, see RDS |
EMS |
Electron Momentum Spectroscopy |
EPMA |
Electron Probe Micro-Analysis |
ESCA |
Electron Spectroscopy for Chemical
Analysis |
ESD |
Electron Stimulated Desorption |
ESDIAD |
Electron Stimulated Desorption Ion
Angle Distributions |
EXAFS |
Extended X-ray Absorption Fine Structure |
FEM |
Field Emission Microscopy |
FIM |
Field Ion Microscopy |
FTIR |
Fourier Transform Infra Red |
FT RA-IR |
Fourier Transform Reflectance-Absorbtion
Infra Red |
HAS |
Helium Atom Scattering |
HDA |
Hemispherical Deflection Analyser |
HEIS |
High Energy Ion Scattering |
HREELS |
High Resolution Electron Energy Loss
Spectroscopy |
IETS |
Inelastic electron tunneling spectroscopy |
KRIPES |
k-Resolved Inverse Photoemission Spectroscopy |
ILS |
Ionisation Loss Spectroscopy |
INS |
Ion Neutralisation Spectroscopy |
IPES |
Inverse Photoemission Spectroscopy |
IRAS |
Infra-Red Absorbtion Spectroscopy |
ISS |
Ion Scattering Spectroscopy |
LEED |
Low Energy Electron Diffraction |
LEEM |
Low Energy Electron Microscopy |
LEIS |
Low Energy Ion Scattering |
LFM |
Lateral Force Microscopy |
MBE |
Molecular Beam Epitaxy |
MBS |
Molecular Beam Scattering |
MCXD |
Magnetic Circular X-ray Dichroism |
MEIS |
Medium Energy Ion Scattering |
MFM |
Magnetic Force Microscopy |
MIES |
Metastable Impact Electron Spectroscopy |
MIR |
Multiple Internal Reflection |
MOCVD |
Metal Organic Chemical Vapour Deposition |
MOKE |
Magneto-Optic Kerr Effect |
NIXSW |
Normal Incidence X-ray Standing Wave |
NEXAFS |
Near-Edge X-ray Absorption Fine Structure |
NSOM |
Near Field Scanning Optical Microscopy |
PAES |
Positron annihilation Auger Electron
Spectroscopy |
PECVD |
Plasma Enhanced Chemical Vapour Deposition |
PEEM |
Photo Emission Electron Microscopy |
Ph.D. |
Photoelectron Diffraction |
PIXE |
Proton Induced X-ray Emission |
PSD |
Photon Stimulated Desorption |
RAIRS |
Reflection Absorbtion Infra-Red Spectroscopy |
RAS |
Reflectance Anisotropy Spectroscopy |
RBS |
Rutherford Back Scattering |
RDS |
Reflectance Difference Spectroscopy |
REFLEXAFS |
Reflection Extended X-ray Absorption
Fine Structure |
RFA |
Retarding Field Analyser |
RHEED |
Reflection High Energy Electron Diffraction |
RIfS |
Reflectometric Interference Spectroscopy |
SAM |
Scanning Auger Microscopy |
SEM |
Scanning Electron Microscopy |
SEMPA |
Scanning Electron Microscopy with
Polarisation Analysis |
SERS |
Surface Enhanced Raman Scattering |
SEXAFS |
Surface Extended X-ray Absorption
Spectroscopy |
SHG |
Second Harmonic Generation |
SH-MOKE |
Second Harmonic Magneto-Optic Kerr
Effect |
SIMS |
Secondary Ion Mass Spectrometry |
SKS |
Scanning Kinetic Spectroscopy |
SMOKE |
Surface Magneto-Optic Kerr Effect |
SNMS |
Sputtered Neutral Mass Spectrometry |
SNOM |
Scanning Near Field Optical Microscopy |
SPIPES |
Spin Polarised Inverse Photoemission
Spectroscopy |
SPEELS |
Spin Polarised Electron Energy Loss
Spectroscopy |
SPLEED |
Spin Polarised Low Energy Electron
Diffraction |
SPM |
Scanning Probe Microscopy |
SPR |
Surface Plasmon Resonance |
SPUPS |
Spin Polarised Ultraviolet Photoelectron
Spectroscopy |
SPXPS |
Spin Polarised X-ray Photoelectron
Spectroscopy |
STM |
Scanning Tunnelling Microscopy |
SXAPS |
Soft X-ray Appearance Potential Spectroscopy |
SXRD |
Surface X-ray Diffraction |
TDS |
Thermal Desorption Spectroscopy |
TEAS |
Thermal Energy Atom Scattering |
TIRF |
Total Internal Reflectance Fluorescence |
TPD |
Temperature Programmed Desorption |
TPRS |
Temperature Programmed Reaction Spectroscopy |
TXRF |
Total Reflection X-ray Fluorescence |
UHV |
Ultra High Vacuum |
UPS |
Ultraviolet Photoemission Spectroscopy |
XANES |
X-ray Absorption Near-Edge Structure |
XPD |
X-ray Photoelectron Diffraction |
XPS |
X-ray Photoemission Spectroscopy |
XRR |
X-ray Reflectometry |
XSW |
X-ray Standing Wave |
